Andreev processes in mesoscopic multi-terminal graphene Josephson junctions Fan Zhang1Asmaul Smitha Rashid2Mostafa Tanhayi Ahari3Wei Zhang2 Krishnan Mekkanamkulam Ananthanarayanan2Run Xiao1George J. de

2025-04-27 0 0 7.81MB 9 页 10玖币
侵权投诉
Andreev processes in mesoscopic multi-terminal graphene Josephson junctions
Fan Zhang,1Asmaul Smitha Rashid,2Mostafa Tanhayi Ahari,3Wei Zhang,2
Krishnan Mekkanamkulam Ananthanarayanan,2Run Xiao,1George J. de
Coster,4Matthew J. Gilbert,5, 3 Nitin Samarth,1, and Morteza Kayyalha2,
1Department of Physics, The Pennsylvania State University, University Park, PA 16802, USA
2Department of Electrical Engineering, The Pennsylvania State University, University Park, PA 16802, USA
3Materials Research Laboratory, The Grainger College of Engineering,
University of Illinois, Urbana-Champaign, IL 61801, USA
4DEVCOM Army Research Laboratory, 2800 Powder Mill Rd, Adelphi, MD, 20783, USA
5Department of Electrical Engineering, University of Illinois, Urbana-Champaign, IL 61801, USA
(Dated: October 25, 2022)
There is growing interest in using multi-terminal Josephson junctions (MTJJs) as a platform
to artificially emulate topological phases and to investigate complex superconducting mechanisms
such as quartet and multiplet Cooper pairings. Current experimental signatures in MTJJs have
led to conflicting interpretations of the salient features. In this work, we report a collaborative
experimental and theoretical investigation of graphene-based four-terminal Josephson junctions. We
observe resonant features in the differential resistance maps that resemble those ascribed to multiplet
Cooper pairings. To understand these features, we model our junctions using a circuit network of
coupled two-terminal resistively and capacitively shunted junctions (RCSJs). Under appropriate
bias current, the model predicts that supercurrent flow between two terminals in a four-terminal
geometry may be represented as a sinusoidal function of a weighted sum of the superconducting
phases. We find that the resonant features generated by the RCSJ model are insensitive to the
diffusive or ballistic form of the current-phase relation and junction transparency. Our study suggests
that differential resistance measurements alone are insufficient to conclusively distinguish resonant
Andreev reflection processes from semi-classical circuit-network effects.
I. INTRODUCTION
The Josephson effect is a centerpiece of many quantum
device applications, including superconducting quan-
tum interference devices (SQUIDs) and superconducting
qubits [1,2]. Increasing the number of superconducting
terminals beyond the typical two terminals in Joseph-
son junctions (JJs) leads to non-local coupling of super-
conducting order parameters through a common scatter-
ing region. This non-local coupling has been predicted
to lead to quartet Cooper pairings [3] and macroscopic
multi-channel effects such as phase drag and magnetic
flux transfer [46]; it may also be used to form a supercon-
ducting phase qubit [7]. More recently, multi-terminal
Josephson junctions (MTJJs) have been proposed as a
platform to emulate topological phases in artificial di-
mensions [821]. In MTJJs with nsuperconducting ter-
minals, the energy of the Andreev bound states is a func-
tion of (n1) independent phases. In this context, the
phase differences between superconducting terminals are
treated as quasi-momenta of a crystal forming a Brillouin
zone in (n1) dimensions. The resultant band structure
may display topological properties such as Weyl singu-
larities [10,11]. While providing strong motivation for
Corresponding author: nsamarth@psu.edu
Corresponding author: mzk463@psu.edu
studying the multi-terminal Josephson effect, the explo-
ration of MTJJs as a platform for engineering artificial
topological systems is still nascent.
MTJJs have been experimentally explored in various
materials platforms including graphene/MoRe [2224]
and InAs/Al [2529]. These experiments focused on the
gate and magnetic field dependence of the supercurrent
flow between adjacent and nonadjacent superconducting
terminals [27]. Additionally, these experiments studied
the non-trivial geometric response of the critical current
contour (CCC), a generic characteristic defining the re-
gion in which all the superconducting terminals are at
zero voltage [26]. Recent studies have also reported signa-
tures of quartet pairings [23,25,30], arising from crossed
Andreev reflection processes. However, studies of three-
terminal Josephson junctions [24] and a network of tunnel
junctions [31] argue that the resonant features may also
arise from circuit-network effects.
In this paper, we use a coordinated experimental and
theoretical approach to critically understand and exam-
ine the transport manifestations of Andreev processes
in four-terminal JJs fabricated in hBN-encapsulated
graphene heterostructures. We use device geometries
wherein the superconducting terminals are connected via
a common scattering region such that no individual two-
terminal JJ is formed between the adjacent superconduc-
tors (Fig. 1). Hence, our device geometry allows us to
better explore phenomena that are due to non-local cou-
arXiv:2210.04408v3 [cond-mat.supr-con] 24 Oct 2022
2
pling of superconducting order parameters. We model
our junctions using a circuit network of coupled resis-
tively and capacitively shunted junctions (RCSJs). We
show that the semi-classical RCSJ model reproduces the
observed resonant features, which are similar in nature to
those predicted for multiplet Cooper pairings [23,25,30].
To elucidate the underlying mechanisms giving rise to
these features, we calculate the contribution of the quasi-
particle current which reveals the pair current contribu-
tion to the total current. We further consider materials-
specific properties such as the Fermi surface geometry of
the normal material and junction transparency by incor-
porating the relevant current-phase relation (CPR) into
the RCSJ model. We show that while the Fermi sur-
face geometry is primarily responsible for the shape of
the CCC [26], the resonant features outside of the CCC
are robust to changes in the Fermi surface and junc-
tion transparency. Finally, our study demonstrates that
circuit-network effects, predicted by the RCSJ model,
lead to macroscopic signatures in differential resistance
maps that are identical to those ascribed to distinctly
quantum processes such as multiplet pairings.
The paper is organized as follows. In Sec. II, we dis-
cuss the details of device fabrication. In Sec. III, we de-
scribe the transport data for the asymmetric device. We
also theoretically analyze our junctions using an RCSJ
model. In Sec. IV, we discuss the transport results in
the symmetric device. We establish that multiple An-
dreev reflections (MARs) are responsible for the discrep-
ancies between the experimental and theoretical data. In
Secs. Vand VI, we consider the effect of different CPRs
ranging from ballistic to diffusive transport in the RCSJ
model and analyze the resultant differential resistance
maps. We conclude in Sec. VII.
II. DEVICE FABRICATION
We assemble hBN/graphene/hBN van der Waals het-
erostructures using a standard dry transfer technique,
followed by annealing in H2/Ar gas at 350 C to re-
move polymer residues from the heterostructures [32,33].
The heterostructures are then patterned with electron
beam lithography, followed by dry etching (O2/CHF3),
to define the junction area. Another e-beam lithography
step is performed to define the contact patterns. Finally,
Ti(10 nm)/Al(100 nm) is evaporated to create supercon-
ducting edge contacts. Atomic force microscope (AFM)
images of our four-terminal JJs are shown in Fig. 1(a).
Devices A and B are four-terminal asymmetric and sym-
metric junctions, respectively. The channel length of de-
vice A is 0.8µm and 3 µm along I13 and I24 directions,
respectively. Device B has a circular geometry with a
diameter of 1.3µm. The Dirac point of device A and
B is at Vg=4.5 V and Vg=11.25 V, respectively.
In Fig. 1(a), we show the current directions used for the
transport measurements. We set I1=I3and I2=I4
in our experiments. We perform all of the measurements
FIG. 1. (a) The AFM image of device A. Inset shows the
AFM image of device B. The Josephson junctions are made
of hBN-graphene-hBN (outlined by white dashed line) edge
contacted with superconducting Al terminals. Arrows show
the directions of bias currents. (b) Color map of the differ-
ential resistance (dV13 /dI1) versus applied dc current biases
I1=I3and I2=I4, as indicated in panel (a) of device
A. The differential resistance is measured using a lock-in am-
plifier. Dashed red lines indicate superconducting branches
corresponding to Vjk = 0, where jand kare pairs of super-
conducting terminals as labeled in (b). Vertical lines in the
map along the I2direction are multiple Andreev reflections
corresponding to eV13 = 2∆/n with ∆ 169 µeV. All the
measurements are performed at Vg= 50 V and T= 12 mK.
at T= 12 mK, if not otherwise specified.
III. TRANSPORT IN THE ASYMMETRIC
DEVICE GEOMETRY
We now turn our attention to the transport char-
acteristics of the multi-terminal junctions in device A.
Fig. 1(b) shows a differential resistance dV13/dI1map
versus I1and I2measured at Vg= 50 V. The directions
indicated by the red dashed lines are branches along the
local minima of dV13/dI1and satisfy Vjk = 0 conditions
as labeled. These conditions correspond to supercurrent
flow between terminals jand k. The vertical lines in
the map along the I2direction are signatures of MARs.
Along these lines, eV13 2∆/n, where eis the electron
charge, ∆ is the superconducting gap, and nis an in-
teger. We calculate an induced superconducting gap of
169 µeV by fitting eV13 to 2/n. The calculated gap is
consistent with the gap we obtain from the temperature-
dependent measurement. The coherence length based on
this gap size is ξ= ¯hvF1.2 µm, where ¯his the
reduced Planck constant and vF1×106m/s is the
Fermi velocity of graphene. The MAR signatures are
only observed along terminals 1 and 3, with distance
0.8 µm< ξ, whereas no MAR is observed along terminals
2 and 4, with distance 3µm> ξ. This observation is
consistent with phase-coherent Andreev processes where
the superconducting phase keeps (loses) its coherence be-
fore being reflected multiple times between terminals 1
and 3 (2 and 4).
To more closely examine the fine structure around the
摘要:

Andreevprocessesinmesoscopicmulti-terminalgrapheneJosephsonjunctionsFanZhang,1AsmaulSmithaRashid,2MostafaTanhayiAhari,3WeiZhang,2KrishnanMekkanamkulamAnanthanarayanan,2RunXiao,1GeorgeJ.deCoster,4MatthewJ.Gilbert,5,3NitinSamarth,1,andMortezaKayyalha2,y1DepartmentofPhysics,ThePennsylvaniaStateUnivers...

展开>> 收起<<
Andreev processes in mesoscopic multi-terminal graphene Josephson junctions Fan Zhang1Asmaul Smitha Rashid2Mostafa Tanhayi Ahari3Wei Zhang2 Krishnan Mekkanamkulam Ananthanarayanan2Run Xiao1George J. de.pdf

共9页,预览2页

还剩页未读, 继续阅读

声明:本站为文档C2C交易模式,即用户上传的文档直接被用户下载,本站只是中间服务平台,本站所有文档下载所得的收益归上传人(含作者)所有。玖贝云文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。若文档所含内容侵犯了您的版权或隐私,请立即通知玖贝云文库,我们立即给予删除!
分类:图书资源 价格:10玖币 属性:9 页 大小:7.81MB 格式:PDF 时间:2025-04-27

开通VIP享超值会员特权

  • 多端同步记录
  • 高速下载文档
  • 免费文档工具
  • 分享文档赚钱
  • 每日登录抽奖
  • 优质衍生服务
/ 9
客服
关注