4
state and |↑i the dark state).
Compared to the 0 T readout in Fig. 1(c), the readout
speed is slightly slower (high-fidelity readout is achieved
in 3 ns rather than 1.8 ns). The reason for this slower
readout is that at 2.0 T we operate with the laser on
resonance with the QD but detuned by 7.5 GHz from
the actual cavity resonance, where we observe optimal
laser suppression at the cost of a reduced Purcell fac-
tor (FP= 6.1 compared to FP= 8.5 exactly at reso-
nance). Consequently, the readout speed is slightly re-
duced compared to 0 T. However, we still achieve high-
fidelity single-shot spin readout within 3 ns.
In order to estimate the spin-readout fidelity, we per-
form Monte Carlo simulations of the single-shot traces
with parameters matching our experiment. The simu-
lations include only a few parameters: the overall sys-
tem efficiency η, the Purcell factor FP, and the spin-flip
time, i.e. the relaxation time, T1. At B= 0, η= 37%.
At B=2.0 T, technical issues result in a slightly reduced
efficiency, η= 25% (Supplementary Sec. VI). The spin
T1= 158 ns was measured via the quantum jump ex-
periments discussed in the next section. We define the
readout-time-dependent fidelity as [34]
F(t)=1−pbright ·ebright(t)−pdark ·edark(t),(1)
where pbright (pdark) is the occupation probability of the
bright (dark) state, and ebright (edark) the respective
time-dependent probability of assigning the spin state
incorrectly. The spin occupation probability distribution
depends on the spin-flip rates, as well as the readout
pulse duration and repetition rate; for our experiments
it is approximately 50:50 (|↑i:|↓i). The error ebright is
determined on these timescales by imperfect overall sys-
tem efficiency (which can lead to a spin projected into
the bright state being incorrectly assigned as the dark
state should no photon be detected). The error edark is
determined by laser leakage (which can lead to a spin
projected into the dark state being incorrectly assigned
as the bright state). Errors due to spin-flips during the
readout time (either due to laser back-action or spin re-
laxation) play a minor role in our experiment. Our Monte
Carlo simulations capture all of these error sources quan-
titatively (edark = 2.6%, ebright = 6.9% at 3 ns; full details
of the fidelity calculation and the influence of readout
errors can be found in Supplementary Sec. VI). The sim-
ulated count fractions show very good agreement with
our experimental results and allow us to extract a max-
imum readout fidelity of (95.2±0.7)% in 3 ns. The cal-
culated readout fidelity as a function of readout-time for
the configurations with |↑i and with |↓i as the bright
state is plotted in Figs. 2(c) and (d), respectively.
C. Repeated readout and quantum jumps
The fast spin readout enables us to probe the electron
spin dynamics. By repeated single-shot measurements of
the spin state, we can determine the spin-flip time from
the correlation between sequential measurements. Addi-
tionally, we can track the electron spin state in real time,
observing quantum jumps as the spin flips. In Fig. 3 (a)
we perform a pulse sequence consisting of two readout
pulses separated by a time τ. Here we fix the length of
both readout pulses to be 3 ns, and the pulse repetition
time to be 400 ns. The first readout pulse is a projec-
tive measurement of the spin state: in effect, the spin is
initialised at τ= 0 with a fidelity given by either ebright
or edark. The second readout pulse can then be used to
determine the spin state at τ > 0 allowing us to measure
the correlation between the two measurement outcomes
as a function of τ. Figure 3 (a) shows the conditional
probability of measuring spin |↑i in the second pulse (as
a function of τ), given that the first read result returned
|↑i. We note that the minimum spacing between the two
pulses is limited to τ&12 ns by the dead time of the
detector. Increasing τdecreases the probability of read-
ing out the same spin state for both pulses due to spin
flips, and for large τthe second read is completely un-
correlated with the first. By fitting an exponential decay
to the data in Fig. 3 (a), we extract a spin-flip time of
150 ±30 ns. Furthermore, the limit as τ→0 of this
conditional probability is approximately 1 −ebright, con-
firming the value of ebright determined from the Monte
Carlo simulations. Similarly, a measurement of the dark-
dark conditional probability confirms the value of edark.
Given that our readout sequence is much shorter than
the spin lifetime, we can use repeated single-shot mea-
surements to detect real-time quantum jumps of the elec-
tron spin state. For that purpose, we send in a train of
3 ns readout pulses spaced by the minimum 12 ns allowed
by the detector’s dead time. We observe quantum jumps
in the spin state, as shown in Fig. 3(b). (In the original
quantum jump experiment, the quantum jumps between
the bright and dark states were driven with weak co-
herent excitation [39]. Here, the jumps are driven by
a dissipative process, energy exchange with the Fermi
sea via co-tunneling.) The time between spin-flip events
during a 2.4 ms total acquisition period is extracted and
summarised in the histogram in Fig. 3(c). From the ex-
ponential decay in the number of events per flip time,
we can extract the spin-flip time to be approximately
165 ns, consistent with the results from the double-pulse
experiment in Fig. 3(a).
III. DISCUSSION AND OUTLOOK
We have demonstrated that the frequency-selective
Purcell enhancement provided by our optical microcav-
ity enables us to perform single-shot readout of a QD
spin state within a few nanoseconds, with a fidelity as
high as 95%. Our results bring the spin readout time
for semiconductor QDs close to the short optical spin
manipulation times [17, 18], and well below previously
demonstrated relaxation (T1) [40] and dephasing (T∗
2)
times [18, 29, 30]. For recent loophole-free Bell tests, en-