Efficient characterization of qudit logical gates with gate set tomography
using an error-free Virtual-Z-gate model
Shuxiang Cao,1, ∗Deep Lall,2, 3 Mustafa Bakr,1Giulio Campanaro,1, †Simone D Fasciati,1
James Wills,1, ‡Vivek Chidambaram,1, §Boris Shteynas,1, ‡Ivan Rungger,2and Peter J Leek1, ¶
1Department of Physics, Clarendon Laboratory, University of Oxford, OX1 3PU, UK
2National Physical Laboratory, Teddington, TW11 0LW, UK
3Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, UK
Gate-set tomography (GST) characterizes the process matrix of quantum logic gates, along with
measurement and state preparation errors in quantum processors. GST typically requires extensive
data collection and significant computational resources for model estimation. We propose a more
efficient GST approach for qudits, utilizing the qudit Hadamard and virtual Z gates to construct
fiducials while assuming virtual Z gates are error-free. Our method reduces the computational costs
of estimating characterization results, making GST more practical at scale. We experimentally
demonstrate the applicability of this approach on a superconducting transmon qutrit.
Characterizing and modeling errors is essential for
the development of quantum processors. Understanding
these details enables the improvements of hardware com-
ponents to eliminate errors, mitigation through quantum
error mitigation strategies [1,2] and evaluating the appli-
cability of quantum error correction codes on a quantum
processor [3,4]. While these characterization methods
were initially developed for processors based on two-level
quantum systems (qubits), the recent advancement of d-
level systems (qudits) (d > 2) requires compatible tools
for characterizing the performance of qudit logic gates.
Qudit-based processors can potentially overcome techni-
cal challenges: they can reduce the number of elementary
units in a physical device [5–8], improve computational
efficiency [7,9–11], and simplify the implementation of
quantum gates [12,13].
Randomized benchmarking (RB) is widely used to ex-
tract average gate infidelity [14,15] and has recently
been demonstrated on a superconducting qutrit [16,17].
While RB can determine the average gate fidelity of
a specific gate, it does not provide detailed error in-
formation. Process tomography [18] is a protocol for
reconstructing the quantum process of a specific gate,
assuming negligible state preparation and measurement
(SPAM) errors, as well as Markovianity of the noise [19].
As an improvement on this method, gate-set tomography
(GST) [20,21] takes the SPAM errors into account; GST
performs process tomography for all gates in the gate set,
including all elementary gates for state preparation and
measurement. The quantum process can then be esti-
mated by optimizing a numerical model that includes the
process matrix and SPAM operators, using information
from the entire gate set. GST has been applied to charac-
terize quantum processes in superconducting qubits [22–
24], ion traps [4], and nuclear spin qubits [25]. It has
also been used for time-domain tracking to analyze pa-
rameter drift in quantum control [26,27]. Although the
techniques for qubit tomography are well-established, the
development of optimal methods for designing GST ex-
periments for qudits still requires further exploration.
In this letter, we propose and demonstrate an efficient
GST method for the characterization of qudits. Our
method utilizes only qudit Hadamard gate and virtual
Z gates for state preparation and measurement in dif-
ferent bases. By assuming that the virtual Z gates are
ideal, we simplify the model to reduce the computational
cost of the GST estimation process. We implement this
method on a superconducting transmon qutrit, extract-
ing the full process matrices and SPAM errors to validate
its practicality. We compare the characterization results
with those from a model that fully parameterizes the vir-
tual Z gates and those assuming ideal virtual Z gates, as
well as with results from RB demonstrating its validity.
The goal of GST is to reconstruct the quantum pro-
cess of all the gates in the gate set G, taking into account
that the initial state preparation and measurements are
imperfect. The following discussion utilizes the superop-
erator formalism [28], representing the density operator
ρand measurement operator Eas a vector in Schmidt-
Hilbert space, denoted by superket |ρ⟩⟩ and superbra
⟨⟨E|, respectively [21] (see the supplementary materials
for more details). In this letter, we perform maximum
likelihood GST [20,29], which collects the following data
from the measured probability distributions:
mijkl =⟨⟨El|F(m)
iGkF(p)
j|ρ0⟩⟩,(1)
where |ρ0⟩⟩ is the initial state and ⟨⟨El|is the measure-
ment basis that can be directly implemented on the hard-
ware. The fiducials F(p)
jrepresent the quantum processes
for preparing the initial states, and F(m)
ifor implement-
ing the measurement basis. Sandwiched between the
fiducials, Gk∈ G is the quantum process in the gate
set, which contains all the gates we are interested in, and
the gates used to implement F(m)
iand F(p)
j. To make the
GST more accurate, Gkis usually replaced with a gate
sequence that amplifies the error, known as a sequence of
germs [30]. The estimated quantum processes ˜
Gkfor all
arXiv:2210.04857v4 [quant-ph] 11 Jul 2024