Bayesian autotuning of Hubbard model quantum simulators Ludmila Szulakowska Jun Dai Department of Chemistry University of British Columbia Vancouver B.C. V6T 1Z1 Canada

2025-04-27 0 0 3.41MB 11 页 10玖币
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Bayesian autotuning of Hubbard model quantum simulators
Ludmila Szulakowska, Jun Dai
Department of Chemistry, University of British Columbia, Vancouver, B.C. V6T 1Z1, Canada
Stewart Blusson Quantum Matter Institute, Vancouver, B.C. V6T 1Z4, Canada
(Dated: October 7, 2022)
Spins in gated semiconductor quantum dots (QDs) are a promising platform for Hubbard model
simulation inaccessible to computation. Precise control of the tunnel couplings by tuning voltages on
metallic gates is vital for a successful QD-based simulator. However, the number of tunable voltages
and the complexity of the relationships between gate voltages and the parameters of the resulting
Hubbard models quickly increase with the number of quantum dots. As a consequence, it is not
known if and how a particular gate geometry yields a target Hubbard model. To solve this problem,
we propose a hybrid machine-learning approach using a combination of support vector machines
(SVMs) and Bayesian optimization (BO) to identify combinations of voltages that realize a desired
Hubbard model. SVM constrains the space of voltages by rejecting voltage combinations producing
potentials unsuitable for tight-binding (TB) approximation. The target voltage combinations are
then identified by BO in the constrained subdomain. For large QD arrays, we propose a scalable
efficient iterative procedure using our SVM-BO approach, which optimises voltage subsets and
utilises a two-QD SVM model for large systems. Our results use experimental gate lithography
images and accurate integrals calculated with linear combinations of harmonic orbitals to train the
machine learning algorithms.
I. INTRODUCTION
Recent progress in manipulating spins in gated semi-
conductor quantum dots (QDs) [1–3] offers an oppor-
tunity for realizing scalable quantum systems for ap-
plications in quantum computing [4–9] and simulation,
such as Kitaev chain or Hubbard model simulation [10–
14]. Hubbard models with many sites, inhomogeneous or
time-varying parameters remain largely unexplored due
to computational complexity, but can be studied exper-
imentally with new generations of gated QD arrays. A
successful QD-based device appropriate for this goal must
provide means to control the charge occupation, chemi-
cal potential of QDs and tunnel couplings with consider-
able precision in order to prepare, manipulate and read
out many-particle quantum states [4, 5, 15, 16]. There-
fore, developing the tools to identify the charge states and
tune their properties to desired operating regimes is vital
for scaling up the complexity of quantum simulators and
discovering new physical phenomena, such as topological
phases [11, 17–20] and strongly-correlated ground states
[10, 12–14, 16, 21]. In particular, the inter-dot tunneling
amplitude requires special attention as it determines the
exchange interaction of spins in QDs [16, 22], which af-
fects all their applications, ranging from qubit design to
parameters of interacting electron models under study.
Design of QD-based simulator relies on well-established
techniques of trapping electrons in electrostatic potential
wells, i.e. QDs, created at the interface of semiconductor
devices build with silicon [1, 2, 23], germanium [3, 24],
III-V materials [13, 25–27] or 2D semiconductors [7, 28–
34]. This confining potential landscape is determined by
a set of voltages applied to lithographically fabricated
metallic gates placed on top of the nanomaterial. Con-
tacts are reservoirs of electrons placed at the edges of the
structure to allow for electron tunneling into the con-
fining potential wells, where they can be manipulated.
Barrier gates are used to control tunneling between QDs,
while plunger gates are designed to alter the depth of each
potential well. Changing the voltages on all those gates
allows for realizing a vast range of electron states for
various applications. Characterization of charge states
achieved with different voltage combinations is usually
performed by repeatedly measuring the charge stability
diagram – an image of transport features as a function
of gate voltages, essential for experimentally tuning the
system to a desired regime [26, 35].
This approach to control the gate voltages limits the
scalability of QD-based simulators. For systems with
many quantum dots, the number of gates is large and
the design complexity makes the voltage calibration pro-
cess impractical for manual tuning. Moreover, in dense
devices, the relative proximity of gates produces substan-
tial cross-talk, which further complicates the independent
QD control [12, 36–38]. An additional obstacle for prac-
tical QD simulators is the presence of charge impurities
unavoidable in the fabrication process, which alter the
potential landscape and lead to non-uniform device per-
formance [12, 36, 37]. These challenges, combined with
variations of gate geometry, and a wide range of material
parameters and screening effects impede the development
of practical tools for experimental control of QD-based
simulators.
Machine learning (ML) has emerged as a promis-
ing tool for some of the experimental challenges with
QD control [37]. Deep neural networks [39–46], im-
age recognition [38, 40, 42, 47–50] and supervised clas-
sification [40, 46, 51] have been demonstrated to aid
charge state characterization [41, 42, 48, 49, 51], cou-
pling parameter tuning [37] and gate voltage optimiza-
tion [36, 41, 43, 46, 49, 52] in a single QD [43, 49, 51],
double QDs [36–38, 42–44, 51], triple QDs and arrays
arXiv:2210.03077v1 [cond-mat.mes-hall] 6 Oct 2022
2
of QDs [36, 37, 41, 45, 48]. Unsupervised statistical
methods [52, 53] and deterministic algorithms [36, 49–
51] have also been used for double-QD tuning. ML also
proven useful for compensating for cross-capacitance in
devices [45], calibration of virtual gates in place of real
ones [45, 48] and in the analysis and parameter-extraction
from charge stability diagrams [48].
A vast majority of these approaches relied on experi-
mentally obtained data as input [38, 48] or intermediate
step in a feedback protocol [36, 37, 42, 49, 51, 52], which
required numerous measurements or involved readjust-
ments and recapturing procedures [36, 37, 42, 43, 49, 51–
53]. Although scarcity of experimental data has been
addressed in Refs [43, 44] with synthetic data, many ML
solutions for QD simulators suffer from crude theoretical
assumptions. This includes the Thomas-Fermi approxi-
mation for electron density [44, 54], the use of exponen-
tial fits to tunneling couplings [48] or constant interac-
tion model with weak coupling and absent barrier gates
[50], which limits their applicability to a wider range of
designs and materials. Another limitation of the opti-
mization techniques used in Refs [38, 45] is the need for
obtaining the gradients of gate voltages in the parameter
search, which may be prone to vanishing gradient prob-
lem [55]. The relationship between gate voltages and the
parameters of the resulting quantum simulator is further
complicated by the scarcity of the physical simulation
domain: the majority of the voltage combinations pro-
duce unphysical potentials. Thus, an automated first-
principle design of quantum simulators must be able to
recognize the physical subdomain of experimentally tun-
able parameters.
To address this problem, we propose a hybrid machine-
learning approach using a combination of support vector
machines (SVMs) and Bayesian optimization to identify
combinations of voltages that realize a desired Hubbard
model. SVM constrains the space of voltages by rejecting
voltage combinations producing potentials unsuitable for
tight-binding (TB) approximation. The target voltage
combinations are then identified by Bayesian optimiza-
tion (BO) in the constrained subdomain. We perform
BO of gate voltages to produce a double QD system with
tailored tunneling parameter tand on-site Hubbard en-
ergy U, using experimental gate lithography images as
input for realistic calculations of tand Uwith the linear
combination of harmonic orbitals method (LCHO) [56].
This approach allows us to predict tand Ufor variable
electrode design and with flexible material parameters
and custom heterostructures. Our BO procedure oper-
ates without gradients or input from experimental charge
stability diagrams, which are tedious to measure for large
systems. BO is also suitable for problems with multiple
local optima and noisy data. We also develop an itera-
tive, scalable SVM-BO approach for multiple-site arrays,
which is able to reach optimal solution by only optimis-
ing subsets of voltages at a time and uses only the two-
site SVM. We predict the optimal voltage combination
needed in experiment to prepare an on-demand double
QD Hubbard model within 1.5% error for model gates
and 6% for experimental gates, as well as for three-site
system with 10% error. This procedure can be combined
with existing methods of preparing a charged state within
quantum dots [36, 41–43, 46, 48, 49, 51, 52].
This paper is organized as follows: Section I describes
the numerical calculations of the electrostatic potentials
from the metallic gate input image by solving Poisson’s
equation. Section II presents the SVM model developed
to classify voltage combinations and demonstrates its ex-
cellent performance for rejecting undesired voltage com-
binations for two gate designs: an ideal simple-shaped
gate set and a realistic experimental gate set obtained
from lithography images. Section III describes the LCHO
method for the calculation of the Hubbard model param-
eters and presents the results for possible U/t ratios that
can be achieved with various gate designs. The adapta-
tion of BO for the title problem is described in Section IV.
We present our results on optimal voltage combinations
for the model and experimental sets of gates in Section
V.
II. ELECTROSTATIC POTENTIAL FROM
METALLIC GATES
We begin by computing the electrostatic confining po-
tential produced by two sets of metallic gates: the model
basic-shape gates in Fig. 1 and a realistic gate image
from experiment [57] in Fig. 1. Both sets of metallic
gates are assumed to be 10 nm tall and are placed within
a heterostructure inside a material with = 10 (Fig. 1).
The pattern of the gates serves as input to a finite differ-
ence numerical method solving the Poisson’s equation:
∇ · (r)V(r)=ρ(r)
0
,(1)
where r= (x, y, z)is the position vector in 3D space, ρ
is the charge density, (r)is the dielectric constant and
0is the permittivity of free space.
We use finite difference method with the varied dielec-
tric constant and two types of boundary conditions: the
Dirichlet boundary condition at the top and bottom of
computational box as well as inside the box, where the
gate is placed, the Neumann boundary condition at the
sides of the computational box, in xand ydirection. We
use a grid of 150×150×127 points in x×y×zdirections.
The sample is modeled with 30nm of vaccum above the
heterostructure and 30nm wetting layer below the metal-
lic gate layer. The successive over-relaxation technique
[58] is used to speed up the numerical procedure.
Fig 1 shows the resulting 2D electrostatic potential (for
experimental gates) for an sample set of voltages, consist-
ing of two confining wells (quantum dots) which act as
sites in a 2-site Hubbard model. The red line marks a 1D
cut of the potential passing through the minima of the
two wells. The 1D example potential cuts for model as
well as experimental gates are shown in Fig. 1.
3
[eV]
vaccum
silicon
ab c
def
FIG. 1: a) Model gate design with 2 confining plunger
gates and 3 barrier gates controlling the tunnelling. b)
Image of experimental gate design with 2 plunger gates,
5 barrier gates and 4 accumulation gates. Red box corre-
sponds to the 2D potential landscape shown in c). Two
potential wells are visible (dark blue) in c) Red line corre-
sponds to crosssection potential in f). d) Semiconductor
heterostructure design crosssection along z axis used for
numerical Poisson equation solution. Metallic gates are
placed inside the heterostructure with silicon substrate.
Colors denote dielectric constant regions. Red line cor-
responds to 2DEG subject to confinement. e) Confin-
ing 2QD potential for model gate deisgn (cut along x).
f) Confining 1QD potential for experimental gate design
(cut along x).
III. HUBBARD MODEL SIMULATION
DOMAIN
In a typical experiment with gated QDs, each QD is
tuned by 3electrodes. As the number of QDs increases
as needed for many-site Hubbard models, the space of
gate voltages becomes high-dimensional. More impor-
tantly, the vast majority of the gate voltage combinations
results in electrostatic potentials that are unsuitable for
quantum simulation of Hubbard models and must, there-
fore, be discarded as unphysical. Identifying the target
gate voltages thus amounts to optimization in a highly
constrained subdomain.
In order to identify the subdomain of gate voltages pro-
ducing suitable potentials, we develop an SVM filter of
gate voltages. We use SVM to solve a classification prob-
lem as implemented in the scikit-learn python library [59]
with a radial basis function (RBF) kernel. The SVM
models are trained by the results of single-particle (SP)
quantum calculation. For a given combination of volt-
ages, we obtain the electrostatic potential as described
in Section II and solve the Schrödiger equation to obtain
the particle density pi[1,N0]for NN0lowest-energy
eigenstates.
We adopt the following criteria for the classification
problem. The gate voltages are accepted as suitable for
quantum simulation of the Hubbard models provided: a)
a significant portion p=p1·p2> p0of the particle
density in well 1 or 2 (p1or p2) is enclosed within a given
radius Rfrom the centres of the quantum dots (and the
charge density within any single well does not vanish); b)
a chemical potential µis set and all N < N0SP energy
levels Eiare populated, i.e. EN0µ. For the present
calculations, we use N0= 6, p0= 0.05, R = 50 nm, µ=
0.15 eV. SVM is trained over 5·104training points and
achieves approximately 99% overall success and above
98% rejection success.
a
b
c
d
e f g
FIG. 2: a) (b) Potentials classified as rejected (accepted)
during SVM testing, in agreement with training labels.
Grey lines represent all potentials included in classifica-
tion. The potentials in b) follow a unified trend, while
those in a) do not. c) (d) Potentials classified as rejected
(accepted) during SVM testing, contrary to training la-
bels. c) and d) are borderline examples and results de-
pend on training label parameters. It is apparent that
the SVM classification accepts a good selection of poten-
tials for Hubbard model. e) (f) Classification of poten-
tials in space of voltages for cuts along plunger-plunger
(plunger-barrier) voltage plane. Percent of accepted po-
tentials during test as a function of the size of the train-
ing sample (model gates). The accepted portion is of the
order of 2% for large enough sample size.
The classification problem we consider here is imbal-
anced, i.e. around 2% of the potentials are suitable for
Hubbard model. In practice, it is important to tune this
摘要:

BayesianautotuningofHubbardmodelquantumsimulatorsLudmilaSzulakowska,JunDaiDepartmentofChemistry,UniversityofBritishColumbia,Vancouver,B.C.V6T1Z1,CanadaStewartBlussonQuantumMatterInstitute,Vancouver,B.C.V6T1Z4,Canada(Dated:October7,2022)Spinsingatedsemiconductorquantumdots(QDs)areapromisingplatformfo...

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