
Regularization of dielectric tensor tomography using total
variation
HERVE HUGONNET,1,2 † SEUNGWOO SHIN ,3 † AND YONGKEUNPARK1,2,4,*
1Department of Physics, Korea Advanced Institute of Science and Technology (KAIST), Daejeon 34141, South Korea
2KAIST Institute for Health Science and Technology, KAIST, Daejeon 34141, South Korea
3Department of Physics, University of California at Santa Barbara, Santa Barbara, CA 93106, USA
4Tomocube Inc., Daejeon 34109, South Korea
†These authors equally contributed to the work.
*yk.park@kaist.ac.kr
Abstract: Dielectric tensor tomography reconstructs the three-dimensional dielectric tensors of microscopic objects and
provides information about the crystalline structure orientations and principal refractive indices. Because dielectric tensor
tomography is based on transmission measurement, it suffers from the missing cone problem, which causes poor axial
resolution, underestimation of the refractive index, and halo artifacts. In this study, we present the generalization of total
variation regularization to three-dimensional tensor distributions. In particular, demonstrate the reduction of artifacts when
applied to dielectric tensor tomography.
1. Introduction
Dielectric tensor tomography (DTT) is a recent development in microscopy that enables the reconstruction of the three-
dimensional (3D) dielectric tensor distribution of a sample [1]. The dielectric tensor is a measurement of the 3D optical
anisotropy, which fundamentally describes the light-matter interaction considering polarization of light, optical anisotropy, and
molecular orientations. The intrinsic information of optically anisotropic materials, including the principal refractive indices
(RIs) and crystalline structure orientation, can be obtained by diagonalizing the dielectric tensor. The unique ability of DTT to
directly reconstruct the dielectric tensor is expected to be utilized in many disciplines, from metrology and soft-matter physics
to biology [2-8]. Previous methods such as polarized light microscopy [9] (Fig. 1a), polarization-dependent digital holographic
microscopy [10-14], polarization-dependent optical diffraction tomography [15-17] or fluorescence-based imaging techniques
[18] can only provide limited information about the sample anisotropy or require some assumptions to retrieve the dielectric
tensor. On the other hand, DTT can directly access the full dielectric tensor by solving a vectorial wave equation. However,
DTT is based on light transmission three-dimensional quantitative phase imaging (QPI) measurements [1, 19], which makes it
inherently affected by the missing-cone problem. Because of the limited numerical aperture of the used imaging system, some
spatial frequencies of a sample cannot be reconstructed, resulting in poor axial resolution, low precision of reconstructed 3D
orientations, underestimation of principal refractive indices, and halo artifacts [20].
Prior knowledge of a sample can be used to alleviate some of these artifacts. In many imaging systems, an image is known
to have a non-negative value, which can be applied using the Gerchberg–Saxton algorithm [21, 22] or in combination with a
denoising algorithm [23]. However, in DTT, the off-diagonal components of the dielectric tensor are often negative, depending
on the orientations of the crystalline structures, hindering the use of such methods. Other minimization-based techniques, such
as total variation (TV) regularization [24, 25] and other optimization methods using the image gradient [26-30] instead suppress
missing cone artifacts by assuming the sparse presence of edges in the data. These methods are promising for the regularization
of DTT data; however, their applicability to tensor data remains to be demonstrated. The last class of regularization uses deep
learning to fill in missing data [31].
Here we propose and demonstrate the generalization of TV regularization to 3D tensor distributions. In particular, we focus
on applying TV to DTT measurements, presenting that component-wise regularization of tensor data from DTT measurements.
We show that using TV can greatly reduce missing cone artifacts: improving both principal RI and crystalline structure direction
information.
2. Methods
2.1 Dielectric tensor tomography
Birefringence is a property of optical materials that causes light to diffract differently depending on the polarization.
Birefringence resulting from supramolecular assemblies or crystalline structures can be physically described by a dielectric
tensor [32]. The dielectric tensor is a generalized physical quantity from the dielectric constant that expresses the speed of light
in a material but is dependent on the polarization. The dielectric tensor is symmetric and can be decomposed using singular
value decomposition into three dielectric constants and three optical axes, with each dielectric constant corresponding to the
speed of light for polarization parallel to a given optical axis [32].