2
In organic disordered materials, the majority of lo-
calised states in the DOS lie below the transport
energy,39 and act as traps, which capture mobile charges.
Trapped charge carriers can be thermally released and
contribute to photoconductivity. During this process
of multiple-trapping-and-release,7,8,18,19 some share of
charge carriers recombines and is lost to the photocur-
rent. In the MTR model, the fraction of the mo-
bile charge carrier density is expressed through parame-
ter θ, the trapping factor, which depends on the DOS
distribution.7,19,40 The density of mobile and trapped
charge carriers is expressed as nc=θn and nt=
(1 −θ)n, respectively, with θ < 1. As the effective den-
sity of trap states is much larger than the charge carrier
density, most relaxed charge carriers will populate energy
sites in the DOS tail.41 Thus, ncnt≈nand θ1, in-
ferring that recombination is mainly trap-mediated and
making the first term in Eq. (2) negligible. Using the
above notations, and noting that due to the nature of
photogeneration, n=p, the recombination rate becomes
R≈(kr,nθn+kr,pθp)n2.(3)
The two recombination channels in Eq. (3) are distin-
guished by the type of mobile charge carrier. One of
the channels is dominant if its recombination prefactor
and/or its trapping factor is larger than for the other
channel. Thus, the exact expression of Rdepends on
(i) the physical parameters, e.g. mobility, of the mobile
charge carrier type through the recombination prefactor
kr, (ii) the DOS of this charge carrier type through the
trapping factor θ, and (iii) the DOS of the more abun-
dant type of charge carrier in the dominant recombina-
tion channel through the total charge carrier concentra-
tion n.
Herein, we focus on the most prevalent models used to
approximate the DOS distributions in organic semicon-
ductors – the gaussian and exponential DOS,20–25 and
their influence on the ideality factor. The depth of trap
states, corresponding to the width of the distribution,
depends on the disorder parameter σand the Urbach en-
ergy EU, respectively. The resulting form of Eq. (3) is
defined by four combinations of these DOS distributions.
The first two involve electrons and holes being described
by the same DOS distribution, whether gaussian, or ex-
ponential, and, for the sake of simplicity, θn=θp. If,
however, the DOS functions of electrons and holes are
different, and θn6=θp, the effective recombination rate
is additionally determined by the type of mobile charge
carrier. For the detailed derivation, the interested reader
is referred to the comprehensive work of Hofacker and
Neher.9Here, we build on a mere fraction of their re-
sults related to the ideality factor and summarise rele-
vant parts of the derivation in the Supplemental Mate-
rial. The ideality factor is obtained by comparing Eq. (1)
to the equations of Rfor the DOS combinations discussed
above (Eqs. (S11) to (S14)).
Without loss of generality, we describe the dominant
recombination channel involving mobile holes recombin-
ing with trapped electrons. The more abundant type
of charge carrier in the recombination channel (nt≈n)
controls the temperature dependence of the ideality fac-
tor, while the mobile charge carrier type (pc=θp·p)
controls the recombination order. If the DOS of elec-
trons is described by an exponential, the ideality factor is
temperature-dependent. When such electrons recombine
with mobile holes from the gaussian DOS, the ideality
factor is independent of σand is expressed as9
nid =EU+kBT
2kBT,(4)
If mobile holes are also represented by the exponential
DOS, the ideality factor is given by9,12,42,43
nid =2EU
EU+kBT.(5)
We will be referring to these models as the mixed DOS
and exponential DOS, respectively. In contrast, if the
DOS of electrons is described by a gaussian, in the low
concentration limit we arrive at nid = 1, independent
of temperature.9,10,44 This is true irrespective of whether
mobile holes come from the gaussian or exponential DOS.
An ideality factor of unity is not observed experimen-
tally in organic semiconductors,11–14 which leads to two
implications. Firstly, in a mixed DOS, the dominant re-
combination channel is the one involving mobile charge
carriers in the gaussian recombining with trapped charges
in the exponential DOS. A gaussian DOS reaches less
deep into the band gap so that θis generally closer to
one than for an exponential DOS. Hence, this channel
will have a larger share of mobile charge carriers lead-
ing, for the same kr, to a larger effective recombination
prefactor than for the other channel. Secondly, the total
distribution of localised states is likely more complicated
than the gaussian for organic materials.
Consequently, in order to shed light on the shape of the
DOS in these systems, our focus should lie on the temper-
ature dependence of the ideality factor, with the models
underlying Eqs. (4) and (5) as the starting point. The
distinct temperature dependence of nid in these expres-
sions allows us to determine the prevailing recombination
mechanism in a solar cell dominated by trap-assisted re-
combination, and the likely form of DOS distribution.
To verify that the DOS can be established through
ideality factors, we chose the well-studied hydrogenated
amorphous silicon solar cell as a reference. We then ex-
pand our investigation to a set of material systems rep-
resentative of typical organic solar cell classes, such as
solution-processed fullerene (P3HT:PC61BM) and non-
fullerene acceptor devices (PM6:Y6), along with ther-
mally evaporated small-molecule solar cells (DCV-V-Fu-
Ind-Fu-V:C60). The details of molecular structure and
device fabrication are given in the Supplemental Mate-
rial.
We employ illumination intensity-dependent Voc mea-
surements to determine ideality factors in the absence