Electronic Origin of High- TCMaximization and Persistence in Trilayer Cuprate Superconductors Xiangyu Luo13y Hao Chen13y Yinghao Li13y Qiang Gao1 Chaohui Yin13 Hongtao
ElectronicOriginofHigh-TCMaximizationandPersistenceinTrilayerCuprateSuperconductorsXiangyuLuo1;3;y,HaoChen1;3;y,YinghaoLi1;3;y,QiangGao1,ChaohuiYin1;3,HongtaoYan1;3,TaiminMiao1;3,HailanLuo1;3,YingjieShu1;3,YiwenChen1;3,ChengtianLin4,ShenjinZhang5,ZhiminWang5,FengfengZhang5,FengYang5,QinjunPeng5,Guod...
2025-04-26
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