
- 6 0 6
e x p .
F i t
L a t t e r a l d e f l e c t i o n ( i n G y= 2 . 2 A - 1 )
c o n t r a s t = I e/(Ie+ I ine) = 7 3 %
a )
300 eV 4H e o n L i F < 1 1 0 >
at 1.28 deg.
kf⊥- k i⊥
kf y
2
3
I n t e n s i t y ( a r b . u n i t s )
S c a t t e r i n g a n g l e θi n + θout(deg)
e x p
F i t
D W F = I e/(Ie+ I i n e )
D W F = 1 3 . 3 %
c )
b )
d )
d i r e c t b e a m
kf y
kf z
ki z
Fig. 2 a) quasi polar transform of the raw diffraction image in panel d).
The polar scattering profile b) corresponds to a full projection of a) onto
the vertical axis. It is fitted by the sum of a narrow Gaussian and a broad
log-normal profile used to evaluate the DWF=Ie/Itot with Itot =Ie+Iine.
Panel c) corresponds to the intensity in a narrow horizontal band centered
at the specular angle. The contrast measured on the Laue circle (c) is
73% much larger than the DWF=13%.
tic diffraction in Sec.4. The results are presented and discussed
in Sec.5.
2 Grazing incidence fast atom diffraction
(GIFAD)
The grazing incidence fast atom diffraction at crystal surfaces uses
atoms in the keV energy range as probed with incidence angles θi
around 1 deg. so that the full diffraction pattern can be recorded
in one take on a position-sensitive detector10–13 as sketched in
Fig.1. A commercial ion source delivers ions at the desired energy,
they pass inside a charge exchange cell filled with the same gas,
where a significant fraction is neutralized by resonant electron
capture, see e.g. Ref.14. After this cell, the ion fraction is deflected
away and the spatial extent and angular divergence of the neu-
tral beam is controlled by two co-linear diaphragms adjustable
between 20 and 100 µm, separated by a distance close to half
a meter before entering into the UHV chamber with the target.
If the projectile encounters a large enough terrace, it undergoes
quasi-specular reflection and the projectiles are scattered within
a cone with an opening angle of θi. Since keV atoms are easily
detected and imaged by micro-channel plates, GIFAD was able to
record a few images per second15,16 with an old ion source.
GIFAD offers a high topological resolution of a few pm on
atomic structure, e.g. surface rumpling17 or charge transfer18,
simple semi-quantitative interpretation14 and, when compared
with exact quantum scattering code4,19–21, a parameter free ac-
curacy6,22. The temperature of the surface affects both its nuclear
and electronic systems. We use the well-documented system of
helium on LiF(001), where the large band-gap prevents electronic
contributions allowing interpretations of inelastic effects only in
terms of thermal motion of the surface atoms.
A definition of the (x,y,z)axis is displayed in Fig.1together
177 K 687 K 1017 K
qout
a) c)
b)
Fig. 3 Three diffraction images recorded with 500 eV helium impinging
with θin=0.75 deg. on LiF [100] at temperatures of 177 K a), 687 K
b) and 1017 K c). The images are normalized to the maximum inten-
sity corresponding here to the elastic specular spot. The rainbow color
palettes are identical with a threshold at 3% of the maximum intensity.
with a typical raw diffraction image on GaAs at elevated temper-
atures. Another raw diffraction image is plotted in Fig.2d) for
a LiF crystal and a helium beam oriented along the [110] direc-
tion. These images correspond to a direct mapping of the final
velocity or wave vector (kf y,kf z) of the scattered projectile per-
pendicular to the crystal axis. Bright elastic diffraction spots are
clearly visible and located on a single circle corresponding to en-
ergy conservation of the motion in the (y,z) plane perpendicu-
lar to the crystal axis probed : k2
f y +k2
f z =k2
⊥=cst. A polar-like
transformation23 brings this Laue circle into a straight line dis-
played in (Fig.2a)). The intensity in this narrow stripe of max-
imum intensity is reported on Fig.2c) and shows well-resolved
diffraction peaks equally separated by multiples of the Bragg an-
gle θB=arctan(Gy/}k//), where }k// =}kcos θin is the projectile
momentum parallel to the crystal axis. Gy=2π/ayis the recipro-
cal lattice vector associated with the distance aybetween atomic
rows perpendicular to the probed crystal axis, taken here as the x
direction. To derive the structure factor, only the elastic intensi-
ties should be considered, however, when elastic intensity is sig-
nificant, the elastic and inelastic relative intensities on the Laue
circle Imwere found identical24 so that Fig.2c) can be directly
exploited.
The projection of Fig.2a) on the vertical axis produces the po-
lar scattering profile in Fig.2b) showing a narrow elastic peak on
top of a broader inelastic scattering profile. The relative weight of
the elastic peak can be estimated using a simple fit where the elas-
tic component is represented by a narrow Gaussian peak and the
inelastic one by a broader, slightly asymmetric log-normal pro-
file f(θ) = 1
wθ√2πexp(−(lnθ−ln θs)2
2w2)25–27. Assuming that the im-
age contains only the gently scattered projectile that did not en-
counter major surface defects, this ratio DWF=Ie/Itot is believed
to be a direct measurement of the Debye-Waller factor. It is differ-
ent from the standard definition used in TEAS DWF=Ie/I0where
I0would be the intensity of the direct beam which, in practice,
is never measured directly with the same detector. In GIFAD, the
direct beam is always measured, either directly or through a cal-
ibrated attenuation grid, because both the exact beam position
and line-profile are mandatory for accurate analysis. It reveals
that for the present cleaved LiF sample, the intensity scattered by
2 | 1–9
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